Microstructure Evolution of Tin–Lead Solder

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Effects of process conditions on reliability, microstructure evolution and failure modes of SnAgCu solder joints

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ژورنال

عنوان ژورنال: IEEE Transactions on Components and Packaging Technologies

سال: 2004

ISSN: 1521-3331

DOI: 10.1109/tcapt.2004.838908